Microscope Autofocus: Active vs. Passive Methods for Equipment Design

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Masato Yabe

Masato Yabe

23 December, 2021

To support equipment and instrument designers, we supply an extensive range of objectives and other optical parts to microscope-based imaging system manufacturers. These components help their engineers design high-quality optical inspection equipment easily and efficiently.

One essential component for these design projects is active autofocus technology. It provides automated focusing when combined with a microscope's motorized Z-mechanism, lighting system, objectives, and/or digital camera. These units bring many benefits to optical inspection system designs because they use an active method for bringing the sample into focus.

This post will explore the active autofocus method in depth—learn what it is, see how it compares to other methods, and discover its key advantages for optical inspection equipment designs, such as semiconductor inspection.

Comparing Microscope Autofocus Methods: Active vs. Passive

In general, there are two types of autofocus systems:

Passive autofocus method in microscopy

Figure 1. Schematic diagram of the passive autofocus method

Developing an Active Autofocus with a Multi-Point System

Complicated or miniaturized semiconductor designs have led to new autofocus challenges during microscopic inspection. Wiring patterns are finer, and step structures are more complicated.

These autofocus challenges (Figure 2) include:

Unstable microscope focus on semiconductor samples

Figure 2. Causes of unstable focus in semiconductor samples: (left) changes in focus position and (right) scattering at step edges.

To solve these problems, we developed an active autofocus system that uses multiple focus detection points (Figure 3, right). We have also added a function to offset the focus position to the desired observation position by shifting the optical axis of the autofocusing optical system's relay lens. This has eliminated the unstable focus issue (Figures 4 and 5).

Single point autofocus vs multi point autofocus for microscope design

Figure 3. Comparison of in-focus detection points on the sample surface: (left) single-point autofocus system, (right) multi-point autofocus system.

This autofocus technology can be supplied as a component for integration into larger optical inspection equipment. Its main use case is semiconductor inspection equipment.

Focusing position offset function for microscope equipment

Figure 4. Focusing position offset function.

Single point autofocus system

(a) In the single-point system, shifting the sample to the side will shift the focus position.

Multi point autofocus system

(b) In the multi-point system, shifting the same sample to the side does not change the focus position.

Figure 5. Comparison of focus stability against lateral misalignment of a step-shaped sample (bright spots indicate in-focus detection points).

If you’d like to learn more about our active autofocus products or our high-quality optical components to incorporate into your microscope design, please contact us at www.olympus-lifescience.com/oem-components.

Masato Yabe

Masato Yabe

Optical Engineer

Masato Yabe works in the Optical Development division at Evident, where he has been involved in the development of microscope products for 19 years, designing optical systems for objectives and autofocus units. He holds a master’s degree in engineering from Wakayama University in Japan.