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Polarizer Rotation in DIC Microscopy of the Silicon Zoo

DIC Microscopy of Computer Chip Surfaces - Java Tutorial

Entries in the Silicon Zoo are photographed under conditions of differential interference contrast (DIC) illumination with a retardation plate in the light path.

This tutorial explores how polarizer rotation affects image color and contrast during examination of integrated circuit surfaces. To operate the applet, use the slider to simulate rotation of the polarizer in the DIC light path. As the slider is moved, the color characteristics and contrast of the image is varied in a manner dependent upon the surface properties of the integrated circuit. A radio button controls addition and removal of the retardation plate from the pathway. The pull-down menu allows visitors to select from a range of different samples.

Contributing Authors

Mortimer Abramowitz - Olympus America, Inc., Two Corporate Center Drive., Melville, New York, 11747.

Kirill I. Tchourioukanov and Michael W. Davidson - National High Magnetic Field Laboratory, 1800 East Paul Dirac Dr., The Florida State University, Tallahassee, Florida, 32310.

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