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Virtual Microscopy Interactive Tutorials

Section Overview:

Welcome to the Olympus Microscopy Resource Center Virtual Microscopy Website. We invite you to visit the interactive Java-powered virtual microscopes that we have constructed. These virtual microscopes explore specimen focus, illumination intensity, magnification, and translation---operating essentially in a manner that is identical to real-life microscopes.

  • Magnifying Microscopy

    Explore and learn more about the effect of increasing magnification (equivalent to changing microscope objectives) on the ability to resolve features in a sample in this interactive java tutorial.

  • Laser Scanning Confocal Microscopy

    Laser scanning confocal microscopes employ a pair of pinhole apertures to limit the specimen focal plane to a confined volume approximately a micron in size as featured in this interactive tutorial.

  • Microscopy of Silicon Artwork

    Examine integrated circuits in brightfield, darkfield, and differential interference contrast (DIC) reflected illumination to explore how silicon artwork is photographed in this interactive java tutorial.

  • Phase Plate/Ring Alignment

    Concentric alignment of the condenser phase plate slits with the phase ring is important in phase contrast microscopy. Explore the effect of phase plate/ring alignment on specimen contrast using this technique.

  • Reflected Light Confocal Microscopy

    Explore real-time confocal imaging of integrated circuits with reflected light confocal microscopy. Instructions for operation of the tutorial are given beneath the applet window.

  • Polarized Light Microscopy

    Polarized light microscopy is a useful method to generate contrast in birefringent specimens and to determine qualitative and quantitative aspects of crystallographic axes present in various materials.

  • Microscopy of the Silicon Zoo

    Observe and examine various entries in the Silicon Zoo that were photographed under conditions of differential interference contrast (DIC) illumination with a retardation plate in the light path.

  • Hoffman Modulation Contrast Microscopy

    Discover and explore how rotation of the substage polarizing filter affects image contrast in Hoffman modulation contrast microscopy in this interactive java tutorial.

  • Differential Interference Contrast Microscopy (DIC)

    The DIC interactive java tutorial explores how changes in the orientation the polarizer in a Senarmont compensation system will affect image contrast.

  • Depth-of-Focus in Thick Samples

    The featured simulated-DIC interactive Java tutorial allows the visitor to investigate how microscope depth-of-focus can be modulated to bring various parts of a very thick specimen into sharp focus.

  • Fluorescence Microscopy with Multiple Fluorochromes

    Explore the effects of fluorescence cube filtration of excitation/emission spectra on specimens stained with multiple fluorochromes.

  • Fluorescence Combination Microscopy

    Simulated in this tutorial is the combination of fluorescence microscopy with either phase contrast or differential interference contrast (DIC) microscopy. Toggle between views of the various techniques to produce contrast effects.

  • Scanning Electron Microscopy

    We have teamed up with award-winning electron microscopist Dr. Dennis Kunkel to produce a series of interactive Java tutorials that explore various aspects of virtual Scanning Electron Microscopy (vSEM).
    *No related product available.

  • Rheinberg Illumination (Optical Staining) Microscopy

    Explore how specimen appearance is altered with color changes in both the central and annular filters in a virtual microscope equipped with Rheinberg illumination.
    *No related product available.

Contributing Authors

Mortimer Abramowitz - Olympus America, Inc., Two Corporate Center Drive., Melville, New York, 11747.

Kirill I. Tchourioukanov and Michael W. Davidson - National High Magnetic Field Laboratory, 1800 East Paul Dirac Dr., The Florida State University, Tallahassee, Florida, 32310.


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