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Digital Imaging in Optical Microscopy

Section Overview:

Digitization of a video or electronic image captured through an optical microscope results in a dramatic increase in the ability to enhance features, extract information, or modify the image. When compared to the traditional mechanism of image capture, photomicrography on film, digital imaging and post-acquisition processing enables a reversible, essentially noise-free modification of the image as an ordered matrix of integers rather than a series of analog variations in color and intensity. This section addresses a variety of current topics in image acquisition and processing for optical microscopy.

Review Articles

  • Concepts in Digital Imaging Technology

    Topics covered in this section include CCD operation, binning, blooming, image capture, dynamic range, photodiodes, photomultipliers, and digital manipulation of images plus many more.

  • Basic Properties of Digital Images

    Read in this section about the basic properties of digital images. A digital image is composed of a rectangular (or square) pixel array representing a series of intensity values and ordered through an organized (x,y) coordinate system.

  • Electronic Imaging Detectors

    This discussion is intended to aid in understanding the basics of light detection and to provide a guide for selecting a suitable electronic detector (CCD or video camera system) for specific applications in optical microscopy.

  • Fundamentals of Video Imaging

    Optical images produced in the microscope can be captured using either traditional film techniques, digitally with electronic detectors such as a charge-coupled device (CCD), or with a tube-type video camera.

  • Introduction to CMOS Image Sensors

    CMOS image sensors are designed with the ability to integrate a number of processing and control functions, which lie beyond the primary task of photon collection, directly onto the sensor integrated circuit.

  • Basic Concepts in Digital Image Processing

    Digital image processing enables virtually noise-free modification of an image in the form of a matrix of integers instead of the classical darkroom manipulations necessary for analog images and video signals.

  • Recommended Strategy for Processing Digital Images

    Depending upon the illumination conditions, specimen integrity, and preparation, images captured may require rehabilitation to achieve a balance between scientific accuracy, cosmetic equilibrium, and aesthetic composition.

  • Digital Image Processing Interactive Java Tutorials

    Explore the basic concepts of digital image processing applied to specimens captured in the microscope. Techniques reviewed include contrast, color balance, spatial resolution, and many more.

  • Deconvolution in Optical Microscopy

    Deconvolution is a computationally intensive image processing technique that is being increasingly utilized for improving the contrast and resolution of digital images captured in the microscope.

  • Background Subtraction Toolkit

    This section discusses details concerning the Olympus Background Subtraction Toolkit, which is designed to assist image processing applications by providing uniform backgrounds for specimens captured digitally.

  • Background Subtraction Toolkit Download

    The Olympus digital microscope image Background Subtraction Toolkit is a stand-alone Java application program, which can be utilized to produce uniform backgrounds for digital images captured.

Digital Cameras for Optical Microscopy

  • Olympus DP70 Digital Camera System

    The Olympus DP70 is a digital color camera system that incorporates the latest innovations in imaging technology to enable the capture of superb images in the most demanding current microscopy applications.

  • Olympus DP-10 Digital Camera

    Learn more about the latest innovative features of the Olympus DP-10 Digital Camera, a revolutionary new digital camera specifically designed for critical color photomicrography.

Contributing Authors

Kenneth R. Spring - Scientific Consultant, Lusby, Maryland, 20657.

John C. Russ - Materials Science and Engineering Department, North Carolina State University, Raleigh, North Carolina, 27695.

Renato Turchetta - Microelectronics Group, Instrumentation Department, Rutherford Appleton Laboratory, Chilton, Didcot, OX11 0QX, United Kingdom.

Matthew Parry-Hill, John C. Long, Thomas J. Fellers, and Michael W. Davidson - National High Magnetic Field Laboratory, 1800 East Paul Dirac Dr., The Florida State University, Tallahassee, Florida, 32310.

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