Welcome to the Olympus Microscopy Resource Center Virtual Microscopy Website. We invite you to visit the interactive Java-powered virtual microscopes that we have constructed. These virtual microscopes explore specimen focus, illumination intensity, magnification, and translation---operating essentially in a manner that is identical to real-life microscopes.
Explore and learn more about the effect of increasing magnification (equivalent to changing microscope objectives) on the ability to resolve features in a sample in this interactive java tutorial.
Laser scanning confocal microscopes employ a pair of pinhole apertures to limit the specimen focal plane to a confined volume approximately a micron in size as featured in this interactive tutorial.
Examine integrated circuits in brightfield, darkfield, and differential interference contrast (DIC) reflected illumination to explore how silicon artwork is photographed in this interactive java tutorial.
Concentric alignment of the condenser phase plate slits with the phase ring is important in phase contrast microscopy. Explore the effect of phase plate/ring alignment on specimen contrast using this technique.
Explore real-time confocal imaging of integrated circuits with reflected light confocal microscopy. Instructions for operation of the tutorial are given beneath the applet window.
Polarized light microscopy is a useful method to generate contrast in birefringent specimens and to determine qualitative and quantitative aspects of crystallographic axes present in various materials.
Observe and examine various entries in the Silicon Zoo that were photographed under conditions of differential interference contrast (DIC) illumination with a retardation plate in the light path.
Discover and explore how rotation of the substage polarizing filter affects image contrast in Hoffman modulation contrast microscopy in this interactive java tutorial.
The DIC interactive java tutorial explores how changes in the orientation the polarizer in a Senarmont compensation system will affect image contrast.
The featured simulated-DIC interactive Java tutorial allows the visitor to investigate how microscope depth-of-focus can be modulated to bring various parts of a very thick specimen into sharp focus.
Explore the effects of fluorescence cube filtration of excitation/emission spectra on specimens stained with multiple fluorochromes.
Simulated in this tutorial is the combination of fluorescence microscopy with either phase contrast or differential interference contrast (DIC) microscopy. Toggle between views of the various techniques to produce contrast effects.
We have teamed up with award-winning electron microscopist Dr. Dennis Kunkel to produce a series of interactive Java tutorials that explore various aspects of virtual Scanning Electron Microscopy (vSEM).
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Explore how specimen appearance is altered with color changes in both the central and annular filters in a virtual microscope equipped with Rheinberg illumination.
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